THz-Enhanced DC Ultrafast Electron Diffractometer

نویسندگان

چکیده

Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast sources. Here, we demonstrate an diffractometer with THz-driven pulse compression. The bunches from conventional DC gun are compressed by factor 10 reach duration ~180 fs (FWHM) 10,000 electrons/pulse at 1 kHz repetition rate. resulting source is used in proof-of-principle experiment probe photoinduced dynamics single-crystal silicon. THz-compressed beams produce high-quality diffraction patterns enable observation structural improved time resolution. These results validate maturity sources use precision applications.

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ژورنال

عنوان ژورنال: Ultrafast science

سال: 2021

ISSN: ['2097-0331', '2765-8791']

DOI: https://doi.org/10.34133/2021/9848526